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EP3SE50F780I3N 1900 LABs 488 I/O Programmable IC Chip

Categories Field Programmable Gate Array
Brand Name: Intel / Altera
Model Number: EP3SE50F780I3N
Certification: Lead free / RoHS Compliant
MOQ: 1 pcs
Price: USD 5000-10000 pcs
Payment Terms: T/T, Western Union, Paypal, Trade Assurance, Credit Card
Supply Ability: 36pcs
Delivery Time: 3-5 Day
Packaging Details: International Standard Packaging
Category: IC FPGA
Condition: Original 100%,Brand New and Original,New
Series: Stratix III Enhanced
Number of Logic Array Blocks - LABs: 1900
Number of I/Os: 488 I/O
Package / Case: FBGA-780
Operating Supply Voltage: 1.2 V to 3.3 V
Embedded Block RAM - EBR: 297 kbit
Service: BOM Kitting
Lead time: In Stock,contact us
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EP3SE50F780I3N 1900 LABs 488 I/O Programmable IC Chip

EP3SE50F780I3N Field Programmable Gate Array Stratix III Enhanced


Product AttributeAttribute Value
Intel
FPGA - Field Programmable Gate Array
Stratix III Enhanced
47500
1900
488 I/O
1.2 V to 3.3 V
- 40 C
+ 85 C
SMD/SMT
FBGA-780
Tray
Series:Stratix III
Brand:Intel / Altera
Embedded Block RAM - EBR:297 kbit
Moisture Sensitive:Yes
Product Type:FPGA - Field Programmable Gate Array
Factory Pack Quantity:36
Subcategory:Programmable Logic ICs
Total Memory:5625 kbit
Tradename:Stratix
Part # Aliases:967246

Stratix III devices offer the following features:
■ Up to 1,104 user I/O pins arranged in 24 modular I/O banks that support a wide range of industry I/O standards
■ Dynamic On-Chip Termination (OCT) with auto calibration support on all I/O banks
■ High-speed differential I/O support with serializer/deserializer (SERDES) and dynamic phase alignment (DPA) circuitry for 1.6 Gbps performance
■ Support for high-speed networking and communications bus standards including SPI-4.2, SFI-4, SGMII, Utopia IV, 10 Gigabit Ethernet XSBI, Rapid I/O, and NPSI
■ The only high-density, high-performance FPGA with support for 256-bit AES volatile and non-volatile security key to protect designs
■ Robust on-chip hot socketing and power sequencing support
■ Integrated cyclical redundancy check (CRC) for configuration memory error detection with critical error determination for high availability systems support
■ Up to 16 global clocks, 88 regional clocks, and 116 peripheral clocks per device
■ Up to 12 phase-locked loops (PLLs) per device that support PLL reconfiguration, clock switchover, programmable bandwidth, clock synthesis, and dynamic phase shifting
■ Memory interface support with dedicated DQS logic on all I/O banks
■ Support for high-speed external memory interfaces including DDR, DDR2, DDR3 SDRAM, RLDRAM II, QDR II, and QDR II+ SRAM on up to 24 modular I/O banks



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