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Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode

Categories Scanning Microscope
Brand Name: OPTO-EDU
Model Number: A61.4510
Certification: CE, Rohs
Place of Origin: China
MOQ: 1pc
Price: FOB $1~1000, Depend on Order Quantity
Payment Terms: L/C, Western Union, T/T, MoneyGram
Supply Ability: 5000 pcs/ Month
Delivery Time: 5~20 Days
Packaging Details: Carton Packing, For Export Transportation
Work Mode: "Constant Height Mode Constant Current Mode"
Current Spectrum Curve: " I-V Curve Current-Distance Curve"
XY Scan Range: 5×5um
XY Scan Resolution: 0.05nm
Z Scan Range: 1um
Y Scan Resolution: 0.01nm
Scan Speed: 0.1Hz~62Hz
Scan Angle: 0~360°
Sample Size: "Φ≤68mm H≤20mm "
XY Stage Moving: 15×15mm
Shock-Absorbing Design: Spring Suspension
Optical Syestem: 1~500x Continous Zoom
Output: USB2.0/3.0
Software: Win XP/7/8/10
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Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode

Scanning Tunneling Microscope

  • Miniaturized and detachable design, very easy to carry and classroom teaching
  • The detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong
  • The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample
  • Side CCD observation system, real-time observation of probe needle insertion status and positioning of probe sample scanning area
  • Spring suspension shockproof method, simple and practical, good shockproof effect

◆ Miniaturized and detachable design, very easy to carry and classroom teaching


◆ The detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong


◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan


◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample


◆ Side CCD observation system, real-time observation of the probe needle insertion state and positioning of the probe sample scanning area


◆ Spring suspension shockproof method, simple and practical, good shockproof effect


◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%


A61.4510
Work ModeConstant Height Mode
Constant Current Mode
Current Spectrum CurveI-V Curve
Current-Distance Curve
XY Scan Range5×5um
XY Scan Resolution0.05nm
Z Scan Range1um
Y Scan Resolution0.01nm
Scan Speed0.1Hz~62Hz
Scan Angle0~360°
Sample SizeΦ≤68mm
H≤20mm
XY Stage Moving15×15mm
Shock-Absorbing DesignSpring Suspension
Optical Syestem1~500x Continous Zoom
OutputUSB2.0/3.0
SoftwareWin XP/7/8/10
MicroscopeOptical MicroscopeElectron MicroscopeScanning Probe Microscope
Max Resolution (um)0.180.000110.00008
RemarkOil immersion 1500xImaging diamond carbon atomsImaging high-order graphitic carbon atoms
Probe-Sample InteractionMeasure SignalInformation
ForceElectrostatic ForceShape
Tunnel CurrentCurrentShape, Conductivity
Magnetic ForcePhaseMagnetic Structure
Electrostatic ForcePhasecharge distribution
 ResolutionWorking ConditionWorking TemperationDamge to SampleInspection Depth
SPMAtom Level 0.1nmNormal, Liquid, VacuumRoom or Low TemperationNone1~2 Atom Level
TEMPoint 0.3~0.5nm
Lattice 0.1~0.2nm
High VaccumRoom TemperationSmallUsually <100nm
SEM6-10nmHigh VaccumRoom TemperationSmall10mm @10x
1um @10000x
FIMAtom Level 0.1nmSuper High Vaccum30~80KDamgeAtom Thickness

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