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2 Inch 6H - Semi Silicon Carbide Wafer Low Power Consumption For Detector

Categories SiC Substrate
Brand Name: zmsh
Model Number: 2inch-6h
Place of Origin: china
MOQ: 2pcs
Price: 200usd/pcs by FOB
Supply Ability: 1000pcs
Delivery Time: within 15days
Packaging Details: in cassettes of single wafer containers
material: sic single crystal
industry: semiconductor wafer,
applications: device,epi-ready wafer, 5G,power electronics,detector,
color: green,blue,white
customized: ok
type: 6H-N
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2 Inch 6H - Semi Silicon Carbide Wafer Low Power Consumption For Detector

2inch 6H-Semi sic wafer ,customized sic substrates , 2inch 6H-N sic wafers , sic crystal ingots ,Silicon Carbide Wafer


This 2-inch 6H semi-insulating silicon carbide (SiC) wafer is designed for applications requiring low power consumption, particularly in detectors. Silicon carbide is known for its exceptional high-temperature stability, high breakdown voltage, and excellent thermal conductivity, making it an ideal material for high-performance electronic devices and sensors. The wafer's superior electrical insulation properties and low power consumption significantly enhance detector efficiency and lifespan. As a key component for achieving low-power, high-performance detection technology, this SiC wafer is well-suited for various demanding applications.


About Silicon Carbide SiC crystal
  1. Advantagement
  2. • Low lattice mismatch
  3. • High thermal conductivity
  4. • Low power consumption
  5. • Excellent transient characteristics
  6. • High band gap

Application areas

  • 1 high frequency and high power electronic devices Schottky diodes, JFET, BJT, PiN,
  • diodes, IGBT, MOSFET
  • 2 optoelectronic devices: mainly used in GaN/SiC blue LED substrate material (GaN/SiC) LED

SILICON CARBIDE MATERIAL PROPERTIES


Property4H-SiC, Single Crystal6H-SiC, Single Crystal
Lattice Parametersa=3.076 Å c=10.053 Åa=3.073 Å c=15.117 Å
Stacking SequenceABCBABCACB
Mohs Hardness≈9.2≈9.2
Density3.21 g/cm33.21 g/cm3
Therm. Expansion Coefficient4-5×10-6/K4-5×10-6/K
Refraction Index @750nm

no = 2.61

ne = 2.66

no = 2.60

ne = 2.65

Dielectric Constantc~9.66c~9.66
Thermal Conductivity (N-type, 0.02 ohm.cm)

a~4.2 W/cm·K@298K

c~3.7 W/cm·K@298K

Thermal Conductivity (Semi-insulating)

a~4.9 W/cm·K@298K

c~3.9 W/cm·K@298K

a~4.6 W/cm·K@298K

c~3.2 W/cm·K@298K

Band-gap3.23 eV3.02 eV
Break-Down Electrical Field3-5×106V/cm3-5×106V/cm
Saturation Drift Velocity2.0×105m/s2.0×105m/s

Standard spec.


2inch diameter Silicon Carbide (SiC) Substrate Specification
GradeZero MPD GradeProduction GradeResearch GradeDummy Grade
Diameter50.8 mm±0.2mm
Thickness330 μm±25μm or 430±25um
Wafer OrientationOff axis : 4.0° toward <1120> ±0.5° for 4H-N/4H-SI On axis : <0001>±0.5° for 6H-N/6H-SI/4H-N/4H-SI
Micropipe Density≤0 cm-2≤5 cm-2≤15 cm-2≤100 cm-2
Resistivity4H-N0.015~0.028 Ω•cm
6H-N0.02~0.1 Ω•cm
4/6H-SI≥1E5 Ω·cm
Primary Flat{10-10}±5.0°
Primary Flat Length18.5 mm±2.0 mm
Secondary Flat Length10.0mm±2.0 mm
Secondary Flat OrientationSilicon face up: 90° CW. from Prime flat ±5.0°
Edge exclusion1 mm
TTV/Bow /Warp≤10μm /≤10μm /≤15μm
RoughnessPolish Ra≤1 nm
CMP Ra≤0.5 nm
Cracks by high intensity lightNone1 allowed, ≤2 mmCumulative length ≤ 10mm, single length≤2mm
Hex Plates by high intensity lightCumulative area ≤1%Cumulative area ≤1%Cumulative area ≤3%
Polytype Areas by high intensity lightNoneCumulative area ≤2%Cumulative area ≤5%
Scratches by high intensity light3 scratches to 1×wafer diameter cumulative length5 scratches to 1×wafer diameter cumulative length5 scratches to 1×wafer diameter cumulative length
edge chipNone3 allowed, ≤0.5 mm each5 allowed, ≤1 mm each

ZMKJ can provides high quality single crystal SiC wafer ( Silicon Carbide ) to electronic and optoelectronic industry . SiC wafer is a next generation semiconductor material , with unique electrical properties and excellent thermal properties , compared to silicon wafer and GaAs wafer , SiC wafer is more suitable for high temperature and high power device application . SiC wafer can be supplied in diameter 2-6 inch , both 4H and 6H SiC , N-type , Nitrogen doped , and semi-insulating type available . Please contact us for more product information .


Packing and Delivery


>Packaging – Logistcs
we concerns each details of the package , cleaning, anti-static , shock treatment .

According to the quantity and shape of the product , we will take a different packaging process! Almost by single wafer cassettes or 25pcs cassette in 100 grade cleaning room.


Product Tags:

sic wafer

  

sic substrate

  
Cheap 2 Inch 6H - Semi Silicon Carbide Wafer Low Power Consumption For Detector for sale
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